System for Dynamic Testing of Analog to Digital Modules
نویسندگان
چکیده
An automated system for dynamic testing of ISA, PCI and VXI modules in frequency range up to 1 MHz developed at Department of Measurement of FEE CTU Prague is presented. The application of the Hewlett-Packard E1430A high precision VXIbus digitizer for evaluation of testing signals is described.
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تاریخ انتشار 2000